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"A Delay-Adjustable, Self-Testable Flip-Flop for Soft-Error Tolerability ..."

Dave Y.-W. Lin, Charles H.-P. Wen (2021)

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DOI: 10.1145/3462171

access: closed

type: Journal Article

metadata version: 2022-06-23

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Dave Y.-W. Lin, Charles H.-P. Wen:
A Delay-Adjustable, Self-Testable Flip-Flop for Soft-Error Tolerability and Delay-Fault Testability. ACM Trans. Design Autom. Electr. Syst. 26(6): 50:1-50:12 (2021)

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