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"Test chip experimental results on high-level structural test."

Ahmad A. Al-Yamani, Edward J. McCluskey (2005)

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DOI: 10.1145/1109118.1109125

access: closed

type: Journal Article

metadata version: 2018-11-06

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Ahmad A. Al-Yamani, Edward J. McCluskey:
Test chip experimental results on high-level structural test. ACM Trans. Design Autom. Electr. Syst. 10(4): 690-701 (2005)

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