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"Quantifying the Alignment of Graph and Features in Deep Learning."

Yifan Qian et al. (2022)

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DOI: 10.1109/TNNLS.2020.3043196

access: closed

type: Journal Article

metadata version: 2023-08-28

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  dblp key:
  - journals/tnn/QianERPB22
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  - https://dblp.org/rec/journals/tnn/QianERPB22
Yifan Qian, Paul Expert, Tom Rieu, Pietro Panzarasa, Mauricio Barahona:
Quantifying the Alignment of Graph and Features in Deep Learning. IEEE Trans. Neural Networks Learn. Syst. 33(4): 1663-1672 (2022)

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