"MGDefect: A Mask-Guided High-Quality Defect Image Generation Method for ..."

Xiaoheng Jiang et al. (2025)

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DOI: 10.1109/TMM.2025.3565978

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type: Journal Article

metadata version: 2025-10-15

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Xiaoheng Jiang, Yingjie Li, Feng Yan, Yang Lu, Changsheng Xu, Mingliang Xu:
MGDefect: A Mask-Guided High-Quality Defect Image Generation Method for Improving Defect Inspection. IEEE Trans. Multim. 27: 6113-6126 (2025)

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