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"Masked contrastive generative adversarial network for defect detection of ..."
Hongwei Zhang et al. (2025)
- Hongwei Zhang, Zhidong Lu, Xiwei Chen, Shuai Lu, Le Yao:
Masked contrastive generative adversarial network for defect detection of yarn-dyed fabric. J. Supercomput. 81(1): 239 (2025)

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