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"AENet: attention enhancement network for industrial defect detection in ..."

Yi Wan et al. (2024)

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DOI: 10.1007/S11227-024-05898-0

access: closed

type: Journal Article

metadata version: 2024-06-19

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Yi Wan, Lingjie Yi, Bo Jiang, Junfan Chen, Yi Jiang, Xianzhong Xie:
AENet: attention enhancement network for industrial defect detection in complex and sensitive scenarios. J. Supercomput. 80(9): 11845-11868 (2024)

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