"Design of universal test sequences for VLSI."

Abraham Lempel, Martin Cohn (1985)

> Home

Details and statistics

DOI: 10.1109/TIT.1985.1057003

access: closed

type: Journal Article

metadata version: 2020-03-10

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tit/LempelC85
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tit/LempelC85
Abraham Lempel, Martin Cohn:
Design of universal test sequences for VLSI. IEEE Trans. Inf. Theory 31(1): 10-17 (1985)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.