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"Key Generation Using External Source Excitation: Capacity, Reliability, ..."

Tzu-Han Chou, Stark C. Draper, Akbar M. Sayeed (2012)

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DOI: 10.1109/TIT.2011.2176311

access: closed

type: Journal Article

metadata version: 2021-04-09

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Tzu-Han Chou, Stark C. Draper, Akbar M. Sayeed:
Key Generation Using External Source Excitation: Capacity, Reliability, and Secrecy Exponent. IEEE Trans. Inf. Theory 58(4): 2455-2474 (2012)

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