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"Remaining useful lifetime prediction of thermally aged power insulated ..."
Adla Ismail et al. (2020)
- Adla Ismail
, Lotfi Saidi
, Mounir Sayadi, Mohamed Benbouzid:
Remaining useful lifetime prediction of thermally aged power insulated gate bipolar transistor based on Gaussian process regression. Trans. Inst. Meas. Control 42(13): 2507-2518 (2020)
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