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"Inaccurate Switching Loss Measurement of SiC MOSFET Caused by Probes: ..."

Zheng Zeng et al. (2021)

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DOI: 10.1109/TIM.2020.3024356

access: closed

type: Journal Article

metadata version: 2023-11-21

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Zheng Zeng, Jin Wang, Liang Wang, Yue Yu, Kaihong Ou:
Inaccurate Switching Loss Measurement of SiC MOSFET Caused by Probes: Modelization, Characterization, and Validation. IEEE Trans. Instrum. Meas. 70: 1-14 (2021)

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