"Multibranched Dilated Convolution With Feature Fusion and Dropout for ..."

Guang Yang et al. (2025)

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DOI: 10.1109/TIM.2025.3529557

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type: Journal Article

metadata version: 2025-04-08

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Guang Yang, Zhijia Yang, Junzhang Pan, Yulin Miao, Shuping Cui:
Multibranched Dilated Convolution With Feature Fusion and Dropout for Accurate Wafer Surface Defect Detection. IEEE Trans. Instrum. Meas. 74: 1-12 (2025)

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