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"A Simultaneous Multi-Directional Defects Measurement Based on ..."
Liping Yan et al. (2023)
- Liping Yan, Lan Tan, Liu Huang, Benyong Chen:
A Simultaneous Multi-Directional Defects Measurement Based on Polarization-Multiplexed Four-Directional Digital Shearography With Large Field of View. IEEE Trans. Instrum. Meas. 72: 1-8 (2023)
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