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"High-Resolution ADC Linearity Testing Using a Fully Digital-Compatible ..."

Hanqing Xing et al. (2009)

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DOI: 10.1109/TIM.2009.2015703

access: closed

type: Journal Article

metadata version: 2022-07-26

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Hanqing Xing, Hanjun Jiang, Degang Chen, Randall L. Geiger:
High-Resolution ADC Linearity Testing Using a Fully Digital-Compatible BIST Strategy. IEEE Trans. Instrum. Meas. 58(8): 2697-2705 (2009)

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