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"Built-In Self-Test for Low-Voltage High-Speed Analog-to-Digital Converters."

Jason Wibbenmeyer, Chien-In Henry Chen (2007)

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DOI: 10.1109/TIM.2007.908343

access: closed

type: Journal Article

metadata version: 2020-06-08

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  - https://dblp.org/rec/journals/tim/WibbenmeyerC07
Jason Wibbenmeyer, Chien-In Henry Chen:
Built-In Self-Test for Low-Voltage High-Speed Analog-to-Digital Converters. IEEE Trans. Instrum. Meas. 56(6): 2748-2756 (2007)

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