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"Test Structure for Characterization of Low-Frequency Noise in CMOS ..."

Chengqing Wei, Yong-Zhong Xiong, Xing Zhou (2010)

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DOI: 10.1109/TIM.2009.2028783

access: closed

type: Journal Article

metadata version: 2020-06-08

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Chengqing Wei, Yong-Zhong Xiong, Xing Zhou:
Test Structure for Characterization of Low-Frequency Noise in CMOS Technologies. IEEE Trans. Instrum. Meas. 59(7): 1860-1865 (2010)

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