"Permittivity measurement of ..."

Zheyao Wang, Jianshe Liu, Litian Liu (2006)

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DOI: 10.1109/TIM.2005.859144

access: closed

type: Journal Article

metadata version: 2020-06-08

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Zheyao Wang, Jianshe Liu, Litian Liu:
Permittivity measurement of Ba_0.5Sr_0.5TiO₃ ferroelectric thin films on multilayered silicon substrates. IEEE Trans. Instrum. Meas. 55(1): 350-356 (2006)

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