"High-accuracy circuits for on-chip capacitive ratio testing and sensor ..."

Bo Wang et al. (1998)

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DOI: 10.1109/19.728781

access: closed

type: Journal Article

metadata version: 2020-06-08

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Bo Wang, Tetsuya Kajita, Tao Sun, Gabor C. Temes:
High-accuracy circuits for on-chip capacitive ratio testing and sensor readout. IEEE Trans. Instrum. Meas. 47(1): 16-20 (1998)

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