default search action
"A Comparison of Uncertainty Evaluation Methods for On-Wafer $S$-Parameter ..."
Valeria Teppati, Andrea Ferrero (2014)
- Valeria Teppati, Andrea Ferrero:
A Comparison of Uncertainty Evaluation Methods for On-Wafer $S$-Parameter Measurements. IEEE Trans. Instrum. Meas. 63(4): 935-942 (2014)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.