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"New methods for determining the void content of silicon single crystals."

Frans Spaepen, Astrid Eliat (1999)

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DOI: 10.1109/19.769570

access: closed

type: Journal Article

metadata version: 2020-06-08

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  - journals/tim/SpaepenE99
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  - https://dblp.org/rec/journals/tim/SpaepenE99
Frans Spaepen, Astrid Eliat:
New methods for determining the void content of silicon single crystals. IEEE Trans. Instrum. Meas. 48(2): 230-232 (1999)

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