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"A precision capacitance cell for measurement of thin film out-of-plane ..."

Chad R. Snyder, Frederick I. Mopsik (2001)

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DOI: 10.1109/19.963185

access: closed

type: Journal Article

metadata version: 2020-06-08

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Chad R. Snyder, Frederick I. Mopsik:
A precision capacitance cell for measurement of thin film out-of-plane expansion. III. Conducting and semiconducting materials. IEEE Trans. Instrum. Meas. 50(5): 1212-1215 (2001)

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