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"Improvements to Millimeter-Wave Dielectric Measurement Using Material ..."

Minjie Shu et al. (2024)

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DOI: 10.1109/TIM.2023.3332341

access: closed

type: Journal Article

metadata version: 2024-01-13

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Minjie Shu, Xiaobang Shang, Nick M. Ridler, Antoine R. Calleau, Alexandros I. Dimitriadis, Anxue Zhang:
Improvements to Millimeter-Wave Dielectric Measurement Using Material Characterization Kit (MCK). IEEE Trans. Instrum. Meas. 73: 1-8 (2024)

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