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"Combined spectral and histogram analysis for fast ADC testing."

António Manuel da Cruz Serra et al. (2005)

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DOI: 10.1109/TIM.2005.851057

access: closed

type: Journal Article

metadata version: 2020-06-08

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  - https://dblp.org/rec/journals/tim/SerraSRMMS05
António Manuel da Cruz Serra, Manuel Fonseca da Silva, Pedro M. Ramos, Raul Carneiro Martins, Linus Michaeli, Ján Saliga:
Combined spectral and histogram analysis for fast ADC testing. IEEE Trans. Instrum. Meas. 54(4): 1617-1623 (2005)

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