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"Long-Term Stability Test on On-Wafer Measurement System in Frequency ..."

Ryo Sakamaki, Masahiro Horibe (2021)

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DOI: 10.1109/TIM.2020.3047486

access: open

type: Journal Article

metadata version: 2023-07-27

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Ryo Sakamaki, Masahiro Horibe:
Long-Term Stability Test on On-Wafer Measurement System in Frequency Ranges up to 325 GHz. IEEE Trans. Instrum. Meas. 70: 1-9 (2021)

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