"A new low-cost RF built-in self-test measurement for system-on-chip ..."

Jee-Youl Ryu, Bruce C. Kim, Iboun Taimiya Sylla (2006)

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DOI: 10.1109/TIM.2006.870317

access: closed

type: Journal Article

metadata version: 2020-06-08

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Jee-Youl Ryu, Bruce C. Kim, Iboun Taimiya Sylla:
A new low-cost RF built-in self-test measurement for system-on-chip transceivers. IEEE Trans. Instrum. Meas. 55(2): 381-388 (2006)

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