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"Fast Defect Inspection Based on Data-Driven Photometric Stereo."
Mingjun Ren et al. (2019)
- Mingjun Ren, Xi Wang, Gaobo Xiao
, Minghan Chen, Lin Fu:
Fast Defect Inspection Based on Data-Driven Photometric Stereo. IEEE Trans. Instrum. Meas. 68(4): 1148-1156 (2019)
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