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"On-Wafer Measurement of Transistor Noise Parameters at NIST."

James Randa, David K. Walker (2007)

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DOI: 10.1109/TIM.2007.891145

access: closed

type: Journal Article

metadata version: 2020-06-08

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James Randa, David K. Walker:
On-Wafer Measurement of Transistor Noise Parameters at NIST. IEEE Trans. Instrum. Meas. 56(2): 551-554 (2007)

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