"Guidelines for a Reliable Analysis of Random Telegraph Noise in Electronic ..."

Francesco Maria Puglisi, Paolo Pavan (2016)

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DOI: 10.1109/TIM.2016.2518880

access: closed

type: Journal Article

metadata version: 2022-12-07

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Francesco Maria Puglisi, Paolo Pavan:
Guidelines for a Reliable Analysis of Random Telegraph Noise in Electronic Devices. IEEE Trans. Instrum. Meas. 65(6): 1435-1442 (2016)

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