"Guest Editorial: Special Issue on the 2013 IEEE International ..."

Dario Petri, Sergey Kharkovsky (2014)

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DOI: 10.1109/TIM.2014.2311906

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type: Journal Article

metadata version: 2020-06-08

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Dario Petri, Sergey Kharkovsky:
Guest Editorial: Special Issue on the 2013 IEEE International Instrumentation and Measurement Technology Conference Minneapolis, MN, USA, May 6-9, 2013. IEEE Trans. Instrum. Meas. 63(5): 991-992 (2014)

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