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"Cryogenic Measurement of CMOS Devices for Quantum Technologies."

Jorge Pérez-Bailón et al. (2023)

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DOI: 10.1109/TIM.2023.3325446

access: closed

type: Journal Article

metadata version: 2023-11-12

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Jorge Pérez-Bailón, Miguel Tarancón, Santiago Celma, Carlos Sánchez-Azqueta:
Cryogenic Measurement of CMOS Devices for Quantum Technologies. IEEE Trans. Instrum. Meas. 72: 1-7 (2023)

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