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"High-Sensitivity Tracking of MOSFET Damage Using Dynamic-Mode Transient ..."

Lucas J. Passmore, Osama O. Awadelkarim, Joseph P. Cusumano (2010)

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DOI: 10.1109/TIM.2009.2028213

access: closed

type: Journal Article

metadata version: 2020-06-08

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Lucas J. Passmore, Osama O. Awadelkarim, Joseph P. Cusumano:
High-Sensitivity Tracking of MOSFET Damage Using Dynamic-Mode Transient Measurements. IEEE Trans. Instrum. Meas. 59(6): 1734-1742 (2010)

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