"Data-Efficient Deep Learning for Printed Circuit Board Defect Detection ..."

Hong Duc Nguyen et al. (2025)

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DOI: 10.1109/TIM.2025.3529089

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type: Journal Article

metadata version: 2025-07-06

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Hong Duc Nguyen, Deruo Cheng, Xinrui Wang, Yiqiong Shi, Bihan Wen:
Data-Efficient Deep Learning for Printed Circuit Board Defect Detection Using X-Ray Images. IEEE Trans. Instrum. Meas. 74: 1-14 (2025)

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