"Measuring the sensitivity of microwave components to bias variations."

Wendy Van Moer, Yves Rolain (2004)

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DOI: 10.1109/TIM.2004.827087

access: closed

type: Journal Article

metadata version: 2020-06-08

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Wendy Van Moer, Yves Rolain:
Measuring the sensitivity of microwave components to bias variations. IEEE Trans. Instrum. Meas. 53(3): 787-791 (2004)

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