"Aging in Commercial Thick- and Thin-Film Resistors: Survey and Uncertainty ..."

Travis C. Mallett (2019)

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DOI: 10.1109/TIM.2019.2938869

access: closed

type: Journal Article

metadata version: 2020-06-08

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Travis C. Mallett:
Aging in Commercial Thick- and Thin-Film Resistors: Survey and Uncertainty Analysis. IEEE Trans. Instrum. Meas. 68(11): 4190-4204 (2019)

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