"Self-Calibrated Absolute Thickness Measurement of Opaque Specimen Based on ..."

Xu Lu et al. (2020)

> Home

Details and statistics

DOI: 10.1109/TIM.2020.2966315

access: closed

type: Journal Article

metadata version: 2025-12-01

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tim/LuYMZZYZJZLYY20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tim/LuYMZZYZJZLYY20
Xu Lu, Yonggui Yuan, Chi Ma, Haibo Zhu, Yunlong Zhu, Zhangjun Yu, Xiaojun Zhang, Fuqiang Jiang, Jianzhong Zhang, Hanyang Li, Jun Yang, Libo Yuan:
Self-Calibrated Absolute Thickness Measurement of Opaque Specimen Based on Differential White Light Interferometry. IEEE Trans. Instrum. Meas. 69(5): 2507-2514 (2020)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.