"Using data compression in automatic test equipment for system-on-chip testing."

Farzin Karimi et al. (2004)

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DOI: 10.1109/TIM.2003.822703

access: closed

type: Journal Article

metadata version: 2020-06-08

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Farzin Karimi, Zainalabedin Navabi, Waleed Meleis, Fabrizio Lombardi:
Using data compression in automatic test equipment for system-on-chip testing. IEEE Trans. Instrum. Meas. 53(2): 308-317 (2004)

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