"Code-Density Test of Analog-to-Digital Converters Using Single ..."

Le Jin, Degang Chen, Randall L. Geiger (2009)

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DOI: 10.1109/TIM.2009.2015700

access: closed

type: Journal Article

metadata version: 2022-07-26

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Le Jin, Degang Chen, Randall L. Geiger:
Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus Signal. IEEE Trans. Instrum. Meas. 58(8): 2679-2685 (2009)

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