"A built-in-test scheme for evaluating the parameters of floating-gate MOS ..."

An Sang Hou (2005)

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DOI: 10.1109/TIM.2005.847338

access: closed

type: Journal Article

metadata version: 2020-06-08

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An Sang Hou:
A built-in-test scheme for evaluating the parameters of floating-gate MOS transistors. IEEE Trans. Instrum. Meas. 54(3): 988-995 (2005)

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