"Multi-Granularity Relation Enhancement Network for Tiny Defect Detection ..."

Feng Guo et al. (2025)

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DOI: 10.1109/TIM.2025.3597003

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type: Journal Article

metadata version: 2025-09-23

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Feng Guo, Zhongshu Chen, Biao Chen, Mengmeng Jing, Lin Zuo:
Multi-Granularity Relation Enhancement Network for Tiny Defect Detection on Printed Circuit Board. IEEE Trans. Instrum. Meas. 74: 1-11 (2025)

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