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"Deep Learning-Based Binocular Image Analysis for In Situ Measurement of ..."
Ji Fan et al. (2023)
- Ji Fan, Tao Liu, Yongcan Shuang, Bo Song, Junghui Chen, Yonghong Tan:
Deep Learning-Based Binocular Image Analysis for In Situ Measurement of Particle Length Distribution During Crystallization Process. IEEE Trans. Instrum. Meas. 72: 1-14 (2023)
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