"An Approach to Locate Parametric Faults in Nonlinear Analog Circuits."

Yong Deng, Yibing Shi, Wei Zhang (2012)

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DOI: 10.1109/TIM.2011.2161930

access: closed

type: Journal Article

metadata version: 2020-06-08

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Yong Deng, Yibing Shi, Wei Zhang:
An Approach to Locate Parametric Faults in Nonlinear Analog Circuits. IEEE Trans. Instrum. Meas. 61(2): 358-367 (2012)

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