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"Guest Editorial Second Special Section of the IEEE Transactions on ..."
Sunil R. Das, Rochit Rajsuman (2006)
- Sunil R. Das, Rochit Rajsuman:
Guest Editorial Second Special Section of the IEEE Transactions on Instrumentation and Measurement in the Area of VLSI Testing - Future of Semiconductor Test. IEEE Trans. Instrum. Meas. 55(2): 378-380 (2006)
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