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"Guest editorial [Special section on innovations in VLSI automatic test ..."

Sunil R. Das, Rochit Rajsuman (2003)

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DOI: 10.1109/TIM.2003.819774

access: closed

type: Journal Article

metadata version: 2020-06-08

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Sunil R. Das, Rochit Rajsuman:
Guest editorial [Special section on innovations in VLSI automatic test equipment (ATEs)]. IEEE Trans. Instrum. Meas. 52(5): 1350-1352 (2003)

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