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"Micro-prober for wafer-level low-noise measurements in MOS devices."

Carmine Ciofi et al. (2003)

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DOI: 10.1109/TIM.2003.817913

access: closed

type: Journal Article

metadata version: 2020-09-05

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  - https://dblp.org/rec/journals/tim/CiofiCPS03
Carmine Ciofi, Felice Crupi, Calogero Pace, Graziella Scandurra:
Micro-prober for wafer-level low-noise measurements in MOS devices. IEEE Trans. Instrum. Meas. 52(5): 1533-1536 (2003)

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