"Temperature controlled oven for low noise measurement systems [for ..."

Carmine Ciofi et al. (2000)

> Home

Details and statistics

DOI: 10.1109/19.850392

access: closed

type: Journal Article

metadata version: 2022-01-03

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tim/CiofiCPN00
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tim/CiofiCPN00
Carmine Ciofi, Ivan Ciofi, Stefano C. Di Pascoli, Bruno Neri:
Temperature controlled oven for low noise measurement systems [for electromigration characterization]. IEEE Trans. Instrum. Meas. 49(3): 546-549 (2000)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.