"An enhanced on-wafer millimeter-wave noise parameter measurement system."

Paul Béland et al. (1999)

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DOI: 10.1109/19.779182

access: closed

type: Journal Article

metadata version: 2020-06-08

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Paul Béland, Langis Roy, Sylvain Labonté, Malcolm Stubbs:
An enhanced on-wafer millimeter-wave noise parameter measurement system. IEEE Trans. Instrum. Meas. 48(4): 825-829 (1999)

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