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"Identification of MOSFET Working State Based on the Stress Wave and Deep ..."

Yun Bai et al. (2022)

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DOI: 10.1109/TIM.2022.3165276

access: closed

type: Journal Article

metadata version: 2023-03-01

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Yun Bai, Songyuan Liu, Yunze He, Liang Cheng, Fei Liu, Xuefeng Geng:
Identification of MOSFET Working State Based on the Stress Wave and Deep Learning. IEEE Trans. Instrum. Meas. 71: 1-9 (2022)

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