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"In-Process Noise Inspection System for Product Fault Detection in a Loud ..."

Woonsang Baek, Duck Young Kim (2021)

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DOI: 10.1109/TIM.2021.3061269

access: closed

type: Journal Article

metadata version: 2021-03-23

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Woonsang Baek, Duck Young Kim:
In-Process Noise Inspection System for Product Fault Detection in a Loud Shop-Floor Environment. IEEE Trans. Instrum. Meas. 70: 1-11 (2021)

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