Stop the war!
Остановите войну!
for scientists:
default search action
"Automated selection of test frequencies for fault diagnosis in analog ..."
Cesare Alippi et al. (2005)
- Cesare Alippi, Marcantonio Catelani, Ada Fort, Marco Mugnaini:
Automated selection of test frequencies for fault diagnosis in analog electronic circuits. IEEE Trans. Instrum. Meas. 54(3): 1033-1044 (2005)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.