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"A Floorprint-Based Defect Tolerance for Nano-Scale Application-Specific IC."

Sanghyun Ahn et al. (2009)

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DOI: 10.1109/TIM.2008.2009416

access: closed

type: Journal Article

metadata version: 2020-06-08

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  - https://dblp.org/rec/journals/tim/AhnPPKP09
Sanghyun Ahn, Zachary D. Patitz, Noh-Jin Park, Hyoung Joong Kim, Nohpill Park:
A Floorprint-Based Defect Tolerance for Nano-Scale Application-Specific IC. IEEE Trans. Instrum. Meas. 58(5): 1283-1290 (2009)

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