"Single-Exposure Optical Measurement of Highly Reflective Surfaces via Deep ..."

Jing Zhang et al. (2023)

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DOI: 10.1109/TII.2022.3185660

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type: Journal Article

metadata version: 2023-01-15

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Jing Zhang, Bin Luo, Fuqian Li, Xingman Niu, Qican Zhang, Yajun Wang, Xiangcheng Chen:
Single-Exposure Optical Measurement of Highly Reflective Surfaces via Deep Sinusoidal Prior for Complex Equipment Production. IEEE Trans. Ind. Informatics 19(2): 2039-2048 (2023)

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